| Mfg. |
Model |
Description |
Reference |
| Advantest |
T3343 |
VLSI Test System |
COM97 |
| Advantest |
T5335 |
Memory Test System |
COM158 |
| Advantest |
T5365P |
Memory Test System |
0918 |
| Advantest |
T5581 Spares |
T5581 Spares |
831 |
| Advantest |
T5581H |
Memory Tester w/M6741AD |
0920 |
| Advantest |
T5581H |
Memory Test System |
0918 |
| Advantest |
T5581H |
Memory Test System |
0918 (a) |
| Advantest |
T5585 |
Memory Test System |
808 |
| Advantest |
T5585 |
Memory Test System (1/2 head) |
0918 |
| Advantest |
T558x /92 |
Spare Boards |
908 |
| Advantest |
T5592 |
Memory Test System |
644 |
| Advantest |
T6673 |
SOC Test System |
COM266 |
| Advantest |
T5335P |
Memory Test System |
COM258 |
| Advantest |
T5382A |
Memory Test System |
COM173 |
| Advantest |
T5581H |
Memory Test System |
0739p |
| Credence |
ASL1000 Spares |
Spare Boards |
0917 |
| Credence |
Duo |
Mixed Signal Test System |
COM69 |
| Credence |
Duo |
Mixed Signal Test System |
COM96 |
| Credence |
Duo SX |
Mixed Signal Test System |
COM122 |
| Credence |
Duo SX |
Mixed Signal Test System |
COM123 |
| Credence |
Duo XP |
Mixed Signal Test System |
COM120 |
| Credence |
Duo XP |
Mixed Signal Test System |
COM121 |
| Credence |
LT1000 |
Mixed Signal Test System |
COM124 |
| Credence |
LT1001 |
Mixed Signal Test System |
COM125 |
| Credence |
Sapphire S40 |
Test System |
0939 |
| Credence |
STS-5020 |
Digital VLSI Test System |
908 |
| Credence |
VistaVision |
Mixed Signal Test System |
COM35 |
| Credence |
Vista |
Mixed Signal Tester |
0915g |
| EPRO |
142AX |
EPROM Tester |
COM83 |
| Kenix |
STS 6120 |
LSI Test System |
1003 |
| Kenix |
STS 6520 |
LSI Test System |
1003 |
| Mosaid |
MS-3495 |
Memory Test System |
COM146 |
| Nextest |
Maverick SST |
Memory Test System |
818 |
| LTX |
Fusion CX |
Test System |
1003 |
| LTX |
Fusion HF |
Test System |
1003 |
| LTX |
Fusion STE |
Test System |
1003 |
| Schlumberger |
ITS 9000KX |
VLSI Test System |
COM89 |
| Schlumberger |
S1650 |
VLSI Test System |
COM12 |
| Sentry |
S10 |
Digital Test System |
COM6 |
| Sentry |
S20/S21 |
Digital Test System |
COM5 |
| Sentry |
Sentinel |
Digital Test System |
COM7 |
| Teradyne |
A567 |
Mixed Signal Test System |
585762 |
| Teradyne |
A570 |
Mixed Signal Test System |
618 |
| Teradyne |
A575 |
Mixed Signal Test System |
0618-1 |
| Teradyne |
A575 |
Mixed Signal Test System |
0618-3 |
| Teradyne |
A585 |
Mixed Signal Test System |
0642-3 |
| Teradyne |
A585 |
Mixed Signal Test System |
0642-4 |
| Teradyne |
A585 |
Mixed Signal Tester |
0915 |
| Teradyne |
Aries |
Memory Test System |
0918 |
| Teradyne |
Catalyst |
D100 64 pins |
0908 (b) |
| Teradyne |
Catalyst |
D100 96 pins |
0908 (a) |
| Teradyne |
Catalyst |
Mixed Signal Test System |
642 |
| Teradyne |
Catalyst |
D200 384 Pins |
717 |
| Teradyne |
Catalyst |
Mixed Signal, D200 224 pins |
0821 |
| Teradyne |
Catalyst |
Mixed Signal, D200 320 pins |
0822-1 |
| Teradyne |
Catalyst |
Mixed Signal Test System |
0824jpdf |
| Teradyne |
J750 |
Test System (Small TH w/320 pins) |
0916 |
| Teradyne |
J937 |
Memory Test System |
COM8 |
| Teradyne |
J971 |
VLSI Test System |
COM23 |
| Teradyne |
J973 |
VLSI Test System |
0918 |
| Teradyne |
J997 |
Memory Test System |
COM26 |
| Teradyne |
Tiger |
SOC Test System |
0828pdf |
| Teradyne |
J993 |
Memory Test System |
COM40 |
| Teradyne |
J995 |
Memory Test System |
COM42 |
| Verigy - Agilent |
82000 D100 w/APG |
Digital VLSI Test System |
COM87 |
| Verigy - Agilent |
82000 D200 |
Digital VLSI Test System |
COM3 |
| Verigy - Agilent |
83000 f120t |
Digital VLSI Test System |
COM136 |
| Verigy - Agilent |
83000 f330t |
Digital VLSI Test System |
COM50 |
| Verigy - Agilent |
83000 f660i |
Digital VLSI Test System |
COM24 |
| Verigy - Agilent |
83000 |
Digital VLSI Test System |
0918 |
| Verigy - Agilent |
93000 C400e |
SOC Test System |
0921 |
| Verigy - Agilent |
93000 P600 |
SOC Test System |
0816 |
| Verigy - Agilent |
93000 P600-RF |
SOC / RF Test System |
0924 |
| Verigy - Agilent |
93000 P1000 |
SOC Test System |
0921 |
| Verigy - Agilent |
94000 XL-IP |
Mixed Signal Test System |
0745-250 |
| Verigy - Agilent |
94000 XL-IP |
Mixed Signal Test System |
0745-252 |
| Verigy - Agilent |
V3301 |
Memory Test System |
817 |
| Verigy - Agilent |
V3304 |
Memory Test System |
0817c |
|
|
